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  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West Zhiqiang Peng Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more

  • Use of New Scanning Technology to Elucidate Ion Channel Mobility

    Friday, April 01, 2005
    Application Note
    Angela Goodacre Kristen M.S. O’Connell Michael M. Tamkun
    Fluorescent chromophores fused to specific proteins have greatly increased our ability to image dynamic events within the living cell. read more

  • A High-Sensitivity Sensor for DSC

    Friday, August 05, 2005
    Application Note
    Rudolf Riesen Blaine Weddle
    A dramatic increase in sensitivity at low signal noise without a significant loss in signal resolution has been achieved with the HSS7 high-sensitivity sensor. read more

  • A Multifrequency Temperature-Modulated Technique For DSC

    Sunday, January 01, 2006
    Application Note
    Markus Schubnell Christoph Heitz Thomas Hütter Steven Sauerbrunn Juergen E.K. Schawe
    In conventional differential scanning calorimetry (DSC), a sample is subjected to a temperature program with a constant heating rate. As a result, the DSC instrument delivers an output signal, which, ... read more

  • Thorough Risk Assessment Supports At-Scale Process Safety

    Wednesday, July 16, 2014
    Application Note
    Urs Groth
    It goes without saying that in any manufacturing environment no one sets out to design an unsafe process. However, it is not enough to ensure a process will be safe under normal operating conditions. read more
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